Bus/Protocol Testing

Astek Corporation's Signal Quality Tester (QP-SQT) provides both a Beta trasmit and receive tester in one tool. QP-SQT references both SAE and 1394 Trade Association test documents for 1394b short haul copper characterization testing.

QP-SIB426, 626 or 926 - Signal Integrity Board with 4, 6 or 9 pin connector

QP-SIGKit-SSIB consists of the following components. Each component may also be purchased individually.

• Option -a -- consists of the following: QP-SSIB Control board, QP-SIA, QP-SSIB-TF-4, QP-SSIB-6-TF, QP-SMA24, QP-SMA26 and QP-DVM
• Option -b -- consists of the following: Everything in option -a plus QP-SSIB-9-TF and QP-SMA29

QP-SIA and associated SSIB Controller provides facilities to test Data/Strobe signaling using an automated process.

Termination and Common Mode Load test fixture

The A9-UHS2-03 Device Test Fixture enables designers to verify compliance of UHS-II card components and devices to the SD Card Association UHS-II PHY Test Specification.

The A9-UHS2-01 Host Test Fixture enables designers to verify compliance of UHS-II host systems to the SD Card Association UHS-II PHY Test Specification.

The A9-UHS2 Test Fixtures enable designers to verify compliance of UHS-II host systems and UHS-II device components to the SD Card Association UHS-II PHY Test Specification.

Astek Corporation's A9-UFS-01 UFS Host Test Fixture provides signal access for UFS card hosts. The test fixture can be used for UFS card host characterization, compliance testing, and protocol analysis.

Astek Corporation's A9-UFS-02 UFS Device Test Fixture provides signal access for UFS card devices. The test fixture can be used for UFS card device characterization, compliance testing, and protocol analysis.

The UFS Test Fixture Kit includes 1 each of the following UFS Test Fixtures:

• UFS Host Test Fixture
• UFS Device Test Fixture
• UFS Device Power Supply

Power Supply for providing 1.8V and 3.3V to UFS Device Test Fixtures. Powered by USB port.

Mid-bus probing for gen2 PCIe lanes

•  Supports Gen 1 and Gen 2 PCI Express probing.
•  x1 to x16 unidirectional
•  x1 to x8 bidirectional
•  27” full cable length.
•  12.5” length on low-profile portion
•  0.68” Mated height
•  1 year limited warranty

PCIe gen3 Mid-bus Probe

• Supports Gen 1, Gen 2, and Gen 3 PCI Express probing.
•  x1 to x16 unidirectional
•  x1 to x8 bidirectional
•  27” full cable length.
•  12.5” length on low-profile portion
•  0.68” Mated height
•  1 year limited warranty

SMP-female to SMA-female adapter for use with UFS Test Fixtures. Qty=1

The recommended number of adapters per fixture is 5 (2 for DIN, 2 for DOUT, and 1 for CLK).